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200-59-693
Electrode Cover
Part No: AMC-CTA7-00A
img{max-width:100%} JEOL US124698 PCB Card JSM-6300F SEM Scanning Electron Microscope Working Spare
FEI Company 4022.192.9204 Processor PCB Card UDTB/N XL 830 FIB-SEM Used Working 200-59-693FEI Company 4022. 192. 9204 Processor PCB Card UDTB N XL 830 FIB SEM Used Working Inventory # A 13996 Part No: 4022. 192. 9204 Model No: UDTB N FEI Company XL 830 DualBeam FIB SEM Focused Ion Beam Scanning Electron Microscope System This FEI Company 4022. 192. 9204 Processor PCB Card is used working surplus. FEI Company XL 830 DualBeam FIB SEM Focused Ion Beam Scanning Electron Microscope System. The physical condition is good, but there are signs of
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